【英文标准名称】:Semiconductordevices.Mechanicalandclimatictestmethods.Latch-uptest
【原文标准名称】:半导体装置.机械和气候耐受性试验方法.闩锁效应测试
【标准号】:BSEN60749-29-2011
【标准状态】:现行
【国别】:英国
【发布日期】:2011-08-31
【实施或试行日期】:2011-08-31
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:
【英文主题词】:Climatictests;Components;Definitions;Destructivetesting;Dimensions;Electricalengineering;Electricalmeasurement;Electronicengineering;Electronicequipmentandcomponents;Environmentaltesting;Failure;Integratedcircuits;Latch-up;Mechanicaltesting;Overvoltagetests;Reliability;Resistance;Resonators;Semiconductordevices;Testing;Testingdevices
【摘要】:ThispartofIEC60749coverstheI-testandtheovervoltagelatch-uptestingofintegratedcircuits.Thistestisclassifiedasdestructive.Thepurposeofthistestistoestablishamethodfordeterminingintegratedcircuit(IC)latchupcharacteristicsandtodefinelatch-upfailurecriteria.Latch-upcharacteristicsareusedindeterminingproductreliabilityandminimizing"notroublefound"(NTF)and"electricaloverstress"(EOS)failuresduetolatch-up.ThistestmethodisprimarilyapplicabletoCMOSdevices.Applicabilitytoothertechnologiesmustbeestablished.Theclassificationoflatch-upasafunctionoftemperatureisdefinedin3.1andthefailurelevelcriteriaaredefinedin3.2
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:26P.;A4
【正文语种】:英语